• DocumentCode
    540395
  • Title

    The effect of dielectric anisotropy and metal surface roughness

  • Author

    Rautio, James C. ; Rautio, Brian J. ; Arvas, Serhend ; Horn, Allen F., III ; Reynolds, John W.

  • Author_Institution
    Sonnet Software Inc., North Syracuse, NY, USA
  • fYear
    2010
  • fDate
    7-10 Dec. 2010
  • Firstpage
    1777
  • Lastpage
    1780
  • Abstract
    We provide an overview of recently published research on the effect of planar substrate dielectric anisotropy and metal surface roughness. The effect of metal roughness on loss is shown to be substantially different from that predicted by commonly used models. Roughness has also been shown to have a substantial effect on velocity of propagation/effective dielectric constant due to the introduction of substantial surface inductance, far in excess of that predicted by smooth surface skin effect. We also explore a recent technique for quickly and easily measuring the dielectric constants of a uniaxially anisotropic planar substrate. Analysis of substrates using the generally incorrect assumption of isotropy can now be avoided.
  • Keywords
    permittivity; substrates; surface roughness; effective dielectric constant; metal surface roughness; planar substrate dielectric anisotropy; smooth surface skin effect; substantial surface inductance; uniaxially anisotropic planar substrate; Anisotropic magnetoresistance; Dielectric constant; Dielectric measurements; Metals; Microstrip; Substrates; Transmission line measurements; Anisotropic media; conductivity; crosstalk; dielectric measurements; electromagnetic analysis; microstrip; transmission line resonators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Conference Proceedings (APMC), 2010 Asia-Pacific
  • Conference_Location
    Yokohama
  • Print_ISBN
    978-1-4244-7590-2
  • Electronic_ISBN
    978-1-902339-22-2
  • Type

    conf

  • Filename
    5728272