Title :
116GHz CMOS injection locked oscillator with −99.3dBc/Hz at 1MHz offset phase noise
Author :
Motoyoshi, Mizuki ; Fujishima, Minoru
Author_Institution :
Grad. Sch. of Adv. Sci. of Matter, Hiroshima Univ., Higashi-Hiroshima, Japan
Abstract :
To satisfy consumer demand for ultrahigh-speed wireless communication, oscillator in the D-band using CMOS as well as compound semiconductors are under development. However, the phase noise is large because a small device is used to achieve a high operating frequency. In the D-band oscillator, suppressing 1/f noise is effective in the improving the phase noise. In this study, a 116 GHz CMOS injection locked oscillator (ILO) with -99.3dBc/Hz at 1MHz offset phase noise is proposed. To improve the phase noise, a master-slave topology and injection locking are used. The circuit is fabricated by 65 nm 1P12M CMOS process. The core size of the chip is 530×520μm2 including pads. At a supply voltage of 0.6 V, the phase noise was -99.3dBc/Hz at 1MHz offset, and the power consumption was 1.45 mW. The oscillator can be tuned from 116.05 to 116.57 GHz. The FOM of the proposed ILO is 18.7dB higher than those of previously reported oscillators.
Keywords :
1/f noise; CMOS analogue integrated circuits; field effect MIMIC; injection locked oscillators; millimetre wave oscillators; phase noise; 1/f noise suppression; 1P12M CMOS process; CMOS injection locked oscillator; D-band oscillator; ILO; compound semiconductors; frequency 116.05 GHz to 116.57 GHz; master-slave topology; offset phase noise; power 1.45 mW; power consumption; size 65 nm; ultrahigh-speed wireless communication; voltage 0.6 V; CMOS integrated circuits; Capacitance; MOSFET circuits; Phase noise; Voltage-controlled oscillators;
Conference_Titel :
Microwave Conference Proceedings (APMC), 2010 Asia-Pacific
Conference_Location :
Yokohama
Print_ISBN :
978-1-4244-7590-2
Electronic_ISBN :
978-1-902339-22-2