On-wafer noise figure measurements of millimeter-wave LNA and mixer

Author

Chang, Yin-Cheng ; Lin, Shuw-Guann ; Chiou, Hwann-Kaeo ; Chang, Da-Chiang ; Juang, Ying-Zong

Author_Institution

Chip Implementation Center, Nat. Appl. Res. Labs., Hsinchu, Taiwan

fYear

2010

fDate

7-10 Dec. 2010

Firstpage

1424

Lastpage

1427

Abstract

An on-wafer measurement technique is performed to characterize the noise figure (NF) at millimeter-wave (MMW) band. Two NF-measurement techniques are reviewed, and the Y-factor method is discussed in detail. The measurement principles and considerations are proposed for the device under test (DUT) at MMW band. The test procedure and setups are performed to measure the V-band amplifier and mixer. The experimental results confirm the validity with high accuracy by comparing with the simulations.

Keywords

built-in self test; circuit testing; low noise amplifiers; millimetre wave amplifiers; millimetre wave mixers; noise measurement; MMW band; NF-measurement; V-band amplifier; Y-factor method; device under test; low noise amplifier; millimeter-wave LNA; millimeter-wave band; mixer; on-wafer noise figure measurement; Frequency measurement; Gain; Loss measurement; Mixers; Noise; Noise measurement; Testing; low noise amplifiers; millimeter wave measurements; mixers; noise figure;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave Conference Proceedings (APMC), 2010 Asia-Pacific

Conference_Location

Yokohama

Print_ISBN

978-1-4244-7590-2

Electronic_ISBN

978-1-902339-22-2

Type

conf

Filename

5728528