DocumentCode
540908
Title
Dynamic terahertz emission microscope
Author
Tonouchi, Masayoshi
Author_Institution
Inst. of Laser Eng., Osaka Univ., Suita, Japan
fYear
2010
fDate
20-23 Sept. 2010
Firstpage
1
Lastpage
2
Abstract
One can observe terahertz (THz) radiation from various kinds of materials, when excited with a femtosecond laser, owing to ultrafast current modulation. THz waves reflect various kinds of properties such as local electric field, particularly ultrafast transient phenomena, in their waveforms. The observation of the THz waveforms enables us to explore ultrafast nature of electronic materials and devices as a THz emission spectroscopy. Pump and probe techniques are typical method to study dynamic reposne of optically excited materials. Here we propose to combine laser THz emission microscope (LTEM) with the pum and probe technique to extend the feature of original LTEM. Pump and probe THz emission microscope has been developed with a special resolution of less than 1 μm, and applied for the study of dynamic response of photoconductive antennas made of SI- GaAs, and LT- GaAs. The results revealed that spatial screening effect plays an important role of enhancement of the THz emission near electrodes.
Keywords
luminescence; optical microscopes; terahertz waves; dynamic terahertz emission microscope; electronic materials; femtosecond laser; laser terahertz emission microscope; local electric field; optically excited materials; photoconductive antennas; pump-probe techniques; spatial screening effect; terahertz emission spectroscopy; terahertz radiation; terahertz waveforms; ultrafast current modulation; ultrafast transient phenomena; Laser beams; Laser excitation; Microscopy; Optical pulses; Probes; Pump lasers; Ultrafast optics;
fLanguage
English
Publisher
ieee
Conference_Titel
ICECom, 2010 Conference Proceedings
Conference_Location
Dubrovnik
Print_ISBN
978-1-61284-998-0
Electronic_ISBN
978-9-5360-3758-2
Type
conf
Filename
5729769
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