• DocumentCode
    540945
  • Title

    Low temperature sinter technology die attachment for power electronic applications

  • Author

    Göbl, C. ; Faltenbacher, J.

  • Author_Institution
    SEMIKRON Elektron. GmbH & Co. KG, Nürnberg, Germany
  • fYear
    2010
  • fDate
    16-18 March 2010
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    New fields of high power inverter systems such like windmills, hybrid cars, hybrid trucks, and off road vehicles require new ways of power electronics integration and packaging. The requirements in size, weight, reliability, durability, ambient temperature, and environment are driving the operation temperatures of power electronics beyond the limits of today´s industrial applications. In industrial power modules solder and bond wires are still the standard joining technologies of power dies. These technologies are reaching their reliability limits if die temperatures are pushed above 135°C. In this paper the authors will discuss how the environmental conditions of applications drive silicon power device selection and packaging technologies. Extreme cooling conditions and ultra high power densities require a package design that needs to work on the thermal and electrical limits of the components without making any compromise in reliability and durability. The low temperature sinter technology can extend the power and thermal cycling capabilities of modern power modules to the values that are required for industrial and automotive applications. Next to the reliability data also a proposal for a high volume manufacturing process of the low temperature sinter technology of multi chip modules will be presented.
  • Keywords
    cooling; elemental semiconductors; multichip modules; power semiconductor devices; reliability; silicon; sintering; Si; die attachment; durability; extreme cooling conditions; low temperature sinter technology; multichip modules; packaging; power electronic applications; power inverter; reliability; silicon power device; thermal cycling; ultrahigh power densities; Junctions; Power electronics; Reliability; Silver; Substrates; Temperature distribution;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Integrated Power Electronics Systems (CIPS), 2010 6th International Conference on
  • Conference_Location
    Nuremberg
  • Print_ISBN
    978-1-61284-814-3
  • Type

    conf

  • Filename
    5730658