DocumentCode :
54235
Title :
A Variability-Aware Adaptive Test Flow for Test Quality Improvement
Author :
Shintani, Michihiro ; Uezono, Takumi ; Takahashi, Tatsuro ; Hatayama, Kazumi ; Aikyo, Takashi ; Masu, Kazuya ; Sato, Takao
Author_Institution :
Grad. Sch. of Inf., Kyoto Univ., Kyoto, Japan
Volume :
33
Issue :
7
fYear :
2014
fDate :
Jul-14
Firstpage :
1056
Lastpage :
1066
Abstract :
In this paper, we propose a process-variability-aware adaptive test flow that realizes efficient and comprehensive detection of parametric faults. A parametric fault is essentially a malfunction in a large-scale integration chip, which is caused by the variability in fabrication processes. In our adaptive test framework, test pattern sets are altered on individual chips in order to apply the optimal set of test patterns for each chip, and thus the test coverage is improved and the test time is reduced. The test pattern is chosen on the basis of parameter estimations measured using an on-chip sensor with respect to statistical timing information. We also propose a novel metric to quantize the test coverage suitable for evaluating the test quality of parametric faults. Our experimental results using an industrial design show that the proposed flow significantly improves the parametric fault coverage and test efficiency compared to conventional test flows.
Keywords :
fault diagnosis; integrated circuit manufacture; integrated circuit testing; large scale integration; parameter estimation; sensors; statistics; adaptive test framework; fabrication processes; industrial design; large-scale integration chip; on-chip sensor; parameter estimations; parametric fault coverage; parametric fault detection; process-variability-aware adaptive test flow; statistical timing information; test coverage; test efficiency; test pattern sets; test quality improvement; Circuit faults; Delays; Large scale integration; Semiconductor device measurement; Testing; Delay variability; parametric faults; path delay test; statistical static timing analysis;
fLanguage :
English
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0070
Type :
jour
DOI :
10.1109/TCAD.2014.2305835
Filename :
6835147
Link To Document :
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