Title :
The test generation for pulse-induced crosstalk faults
Author :
Skobtsov, Yu.A. ; Skobtsov, V.Yu. ; Nasser, I.K.M.
Author_Institution :
CADS Dept., Donetsk Nat. Tech. Univ., Donetsk, Ukraine
Abstract :
It is considered some approach to pulse-induced crosstalk faults test generation which is based on multi-valued logic and genetic algorithm application. Experimental results for combinational circuits showed an effectiveness of suggested solution in the sense of high fault coverage.
Keywords :
crosstalk; genetic algorithms; multivalued logic; genetic algorithm; multivalued logic; pulse-induced crosstalk faults; test generation; Circuit faults; Crosstalk; Delay; Genetic algorithms; Integrated circuit modeling; Testing; Very large scale integration; Crosstalk fault; genetic algorithms; test generation;
Conference_Titel :
CAD Systems in Microelectronics (CADSM), 2011 11th International Conference The Experience of Designing and Application of
Conference_Location :
Polyana-Svalyava
Print_ISBN :
978-1-4577-0042-2
