Title :
Study of real CMOS defects using DefSim educational environment
Author :
Pleskacz, Witold A.
Author_Institution :
Inst. of Microelectron. & Optoelectron., Warsaw Univ. of Technol., Warsaw, Poland
Abstract :
The developed experimental and measurement kit called DefSim facilitates the study of physical defects and their influence on the operation of digital circuits. Both the measurement equipment and the remote access mechanism were created in a full custom way in the frame of the European Union project REASON. DefSim can be used as a first step to understanding the behavior of real physical defects and evaluating newly developed fault models and testing methodologies for modern electronics.
Keywords :
CMOS integrated circuits; fault diagnosis; integrated circuit testing; CMOS defects; DefSim educational environment; digital circuits; fault models; measurement kit; physical defects; remote access mechanism; testing methodologies; Circuit faults; Integrated circuit modeling; Laboratories; Semiconductor device measurement; Servers; Voltage measurement;
Conference_Titel :
CAD Systems in Microelectronics (CADSM), 2011 11th International Conference The Experience of Designing and Application of
Conference_Location :
Polyana-Svalyava
Print_ISBN :
978-1-4577-0042-2
Electronic_ISBN :
978-966-2191-17-2
