DocumentCode
542559
Title
Study of real CMOS defects using DefSim educational environment
Author
Pleskacz, Witold A.
Author_Institution
Inst. of Microelectron. & Optoelectron., Warsaw Univ. of Technol., Warsaw, Poland
fYear
2011
fDate
23-25 Feb. 2011
Firstpage
419
Lastpage
419
Abstract
The developed experimental and measurement kit called DefSim facilitates the study of physical defects and their influence on the operation of digital circuits. Both the measurement equipment and the remote access mechanism were created in a full custom way in the frame of the European Union project REASON. DefSim can be used as a first step to understanding the behavior of real physical defects and evaluating newly developed fault models and testing methodologies for modern electronics.
Keywords
CMOS integrated circuits; fault diagnosis; integrated circuit testing; CMOS defects; DefSim educational environment; digital circuits; fault models; measurement kit; physical defects; remote access mechanism; testing methodologies; Circuit faults; Integrated circuit modeling; Laboratories; Semiconductor device measurement; Servers; Voltage measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
CAD Systems in Microelectronics (CADSM), 2011 11th International Conference The Experience of Designing and Application of
Conference_Location
Polyana-Svalyava
Print_ISBN
978-1-4577-0042-2
Electronic_ISBN
978-966-2191-17-2
Type
conf
Filename
5744519
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