DocumentCode
542576
Title
Valuing reliability of unrestorable systems
Author
Sydor, Andriy
Author_Institution
Lviv Polytech. Nat. Univ., Lviv, Ukraine
fYear
2011
fDate
23-25 Feb. 2011
Firstpage
5
Lastpage
7
Abstract
Main reliability parameters for unrestorable symmetric systems ramified to level 3 and with ageing output elements are examined in this paper. Models for the failure probability, the failure frequency and the failure rate are worked out in the case when the lifetime of ageing output elements is circumscribed by the Weibull distribution.
Keywords
Weibull distribution; reliability; Weibull distribution; reliability; symmetric systems; unrestorable systems; Availability; Exponential distribution; Hierarchical systems; Power system reliability; Reliability engineering; Weibull distribution; ageing elements; reliability parameters; symmetric systems; unrestorable systems;
fLanguage
English
Publisher
ieee
Conference_Titel
CAD Systems in Microelectronics (CADSM), 2011 11th International Conference The Experience of Designing and Application of
Conference_Location
Polyana-Svalyava
Print_ISBN
978-1-4577-0042-2
Electronic_ISBN
978-966-2191-17-2
Type
conf
Filename
5744539
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