• DocumentCode
    54271
  • Title

    Series Stacked Multipath Inductor With High Self Resonant Frequency

  • Author

    Vanukuru, Venkata Narayana Rao ; Chakravorty, Anjan

  • Author_Institution
    Semicond. R&D Center, IBM India Pvt. Ltd., Bangalore, India
  • Volume
    62
  • Issue
    3
  • fYear
    2015
  • fDate
    Mar-15
  • Firstpage
    1058
  • Lastpage
    1062
  • Abstract
    In this brief, a novel combination of multilayer up-down series stacking and multipath architecture for equal path length is explored for the first time to improve the performance of on-chip inductors. The up-down series winding reduces the interlayer capacitance, thereby increasing both the peak quality-factor (Q) frequency ( fQmax) and self resonant frequency (SRF). The crossover interconnection architecture ensures equal path length at every pair of spiral turns in the series stack. This architecture lowers skin and proximity effect losses in the spiral, increasing the slope of Q characteristics. Thus, using the proposed architecture, both the ac resistance and capacitance are simultaneously reduced while realizing higher inductance values. Implemented in a 0.18 μm high resistivity silicon-on-insulator technology using a dual thick metal stack, the proposed inductor achieves more than 10% improvement in peak-Q value, 50% improvement in fQmax, and 100% improvement in SRF values when compared with a conventional series stacked multipath inductor.
  • Keywords
    Q-factor; inductors; silicon-on-insulator; Si; ac resistance; capacitance; crossover interconnection architecture; dual thick metal stack; high self resonant frequency; interlayer capacitance; on-chip inductors; peak quality-factor frequency; proximity effect; self resonant frequency; series stacked multipath inductor; silicon-on-insulator technology; size 0.18 mum; up-down series winding; Capacitance; Inductors; Metals; Proximity effects; Radio frequency; Resistance; Spirals; Crossovers; multipath architecture; quality factor; self resonant frequency (SRF); up-down winding.; up???down winding;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2015.2390293
  • Filename
    7031916