DocumentCode
54271
Title
Series Stacked Multipath Inductor With High Self Resonant Frequency
Author
Vanukuru, Venkata Narayana Rao ; Chakravorty, Anjan
Author_Institution
Semicond. R&D Center, IBM India Pvt. Ltd., Bangalore, India
Volume
62
Issue
3
fYear
2015
fDate
Mar-15
Firstpage
1058
Lastpage
1062
Abstract
In this brief, a novel combination of multilayer up-down series stacking and multipath architecture for equal path length is explored for the first time to improve the performance of on-chip inductors. The up-down series winding reduces the interlayer capacitance, thereby increasing both the peak quality-factor (Q) frequency ( fQmax) and self resonant frequency (SRF). The crossover interconnection architecture ensures equal path length at every pair of spiral turns in the series stack. This architecture lowers skin and proximity effect losses in the spiral, increasing the slope of Q characteristics. Thus, using the proposed architecture, both the ac resistance and capacitance are simultaneously reduced while realizing higher inductance values. Implemented in a 0.18 μm high resistivity silicon-on-insulator technology using a dual thick metal stack, the proposed inductor achieves more than 10% improvement in peak-Q value, 50% improvement in fQmax, and 100% improvement in SRF values when compared with a conventional series stacked multipath inductor.
Keywords
Q-factor; inductors; silicon-on-insulator; Si; ac resistance; capacitance; crossover interconnection architecture; dual thick metal stack; high self resonant frequency; interlayer capacitance; on-chip inductors; peak quality-factor frequency; proximity effect; self resonant frequency; series stacked multipath inductor; silicon-on-insulator technology; size 0.18 mum; up-down series winding; Capacitance; Inductors; Metals; Proximity effects; Radio frequency; Resistance; Spirals; Crossovers; multipath architecture; quality factor; self resonant frequency (SRF); up-down winding.; up???down winding;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/TED.2015.2390293
Filename
7031916
Link To Document