DocumentCode
54277
Title
Equalization-Based Digital Background Calibration Technique for Pipelined ADCs
Author
Zeinali, Behnam ; Moosazadeh, Tohid ; Yavari, Mohammad ; Rodriguez-Vazquez, Angel
Author_Institution
Dept. of Electr. Eng., Amirkabir Univ. of Technol., Tehran, Iran
Volume
22
Issue
2
fYear
2014
fDate
Feb. 2014
Firstpage
322
Lastpage
333
Abstract
In this paper, we present a digital background calibration technique for pipelined analog-to-digital converters (ADCs). In this scheme, the capacitor mismatch, residue gain error, and amplifier nonlinearity are measured and then corrected in digital domain. It is based on the error estimation with nonprecision calibration signals in foreground mode, and an adaptive linear prediction structure is used to convert the foreground scheme to the background one. The proposed foreground technique utilizes the LMS algorithm to estimate the error coefficients without needing high-accuracy calibration signals. Several simulation results in the context of a 12-b 100-MS/s pipelined ADC are provided to verify the usefulness of the proposed calibration technique. Circuit-level simulation results show that the ADC achieves 28-dB signal-to-noise and distortion ratio and 41-dB spurious-free dynamic range improvement, respectively, compared with the noncalibrated ADC.
Keywords
analogue-digital conversion; calibration; least mean squares methods; LMS algorithm; adaptive linear prediction structure; amplifier nonlinearity; capacitor mismatch; circuit-level simulation; digital domain; equalization-based digital background calibration technique; error coefficients; error estimation; foreground mode; high-accuracy calibration signals; nonprecision calibration signals; pipelined ADC; pipelined analog-to-digital converters; residue gain error; spurious-free dynamic range improvement; word length 12 bit; Calibration; Capacitors; Error analysis; Estimation; Least squares approximation; Mathematical model; Vectors; Adaptive linear prediction; LMS algorithm; digital background calibration; pipelined ADCs;
fLanguage
English
Journal_Title
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher
ieee
ISSN
1063-8210
Type
jour
DOI
10.1109/TVLSI.2013.2242208
Filename
6461165
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