DocumentCode
544124
Title
Phase error corrections for Microstrip 8×8 Butler Matrix used in 7 Tesla MRI
Author
Yazdanbakhsh, Pedram ; Solbach, Klaus
Author_Institution
Hochfrequenztech., Univ. Duisburg-Essen, Duisburg, Germany
fYear
2011
fDate
14-16 March 2011
Firstpage
1
Lastpage
4
Abstract
This paper describes a method to determine fixed phase shifters of the Microstrip 8×8 Butler Matrix, realized in one substrate board, which is designed and fabricated for our 7-Tesla Magnetic Resonance Imaging (MRI) system. This method is based on a global optimization problem to minimize a cost function including a variety of 64 functions as a function of the fixed phase shifts of the 8×8 Butler Matrix. Finally, after optimizing this cost function, estimating the phase shifts and finding the phase error of each fixed phase shifter, the phase error corrections are realized using three different methods: shorting bends (filling), adding open-circuited stubs to the lines (shunt capacitance) and cutting small areas of lines (series capacitance).
Keywords
error correction; magnetic resonance imaging; microstrip lines; microstrip resonators; microwave phase shifters; 7-Tesla magnetic resonance imaging; global optimization problem; microstrip butler matrix; open-circuited stubs; phase error corrections; phase shifters; series capacitance; shorting bends; shunt capacitance; substrate board; Butler matrix; Couplers; Equations; Error correction; Magnetic resonance imaging; Microstrip; Phase shifters; Butler Matrix; Genetic Algorithm; MRI; Optimization; Phase Error Corrections;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Conference (GeMIC), 2011 German
Conference_Location
Darmstadt
Print_ISBN
978-1-4244-9225-1
Electronic_ISBN
978-3-9812668-3-2
Type
conf
Filename
5760730
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