• DocumentCode
    544124
  • Title

    Phase error corrections for Microstrip 8×8 Butler Matrix used in 7 Tesla MRI

  • Author

    Yazdanbakhsh, Pedram ; Solbach, Klaus

  • Author_Institution
    Hochfrequenztech., Univ. Duisburg-Essen, Duisburg, Germany
  • fYear
    2011
  • fDate
    14-16 March 2011
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    This paper describes a method to determine fixed phase shifters of the Microstrip 8×8 Butler Matrix, realized in one substrate board, which is designed and fabricated for our 7-Tesla Magnetic Resonance Imaging (MRI) system. This method is based on a global optimization problem to minimize a cost function including a variety of 64 functions as a function of the fixed phase shifts of the 8×8 Butler Matrix. Finally, after optimizing this cost function, estimating the phase shifts and finding the phase error of each fixed phase shifter, the phase error corrections are realized using three different methods: shorting bends (filling), adding open-circuited stubs to the lines (shunt capacitance) and cutting small areas of lines (series capacitance).
  • Keywords
    error correction; magnetic resonance imaging; microstrip lines; microstrip resonators; microwave phase shifters; 7-Tesla magnetic resonance imaging; global optimization problem; microstrip butler matrix; open-circuited stubs; phase error corrections; phase shifters; series capacitance; shorting bends; shunt capacitance; substrate board; Butler matrix; Couplers; Equations; Error correction; Magnetic resonance imaging; Microstrip; Phase shifters; Butler Matrix; Genetic Algorithm; MRI; Optimization; Phase Error Corrections;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Conference (GeMIC), 2011 German
  • Conference_Location
    Darmstadt
  • Print_ISBN
    978-1-4244-9225-1
  • Electronic_ISBN
    978-3-9812668-3-2
  • Type

    conf

  • Filename
    5760730