• DocumentCode
    544166
  • Title

    Custom-made calibration standards for measurements of multilayer substrates

  • Author

    Kotzev, Miroslav ; Schuster, Christian

  • Author_Institution
    Inst. fur Theor. Elektrotechnik, Tech. Univ. Hamburg-Harburg, Hamburg, Germany
  • fYear
    2011
  • fDate
    14-16 March 2011
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    In this paper the authors present custom-made calibration standards for microprobe based measurements on multilayer printed circuit boards. Non ideal short, open and load (SOL) terminations are positioned at the end of through holes (vias). The combination of via plus termination forms a custom-made standard for printed circuit board measurements. The load standard consists of a soldered 47 Ohm (SMD, 0402, 1%) resistor, a solder bridge is used as a short and for the open the via is left open. The usable bandwidth of the standards is studied with the help of a two-tier calibration method. Comparisons of measurements performed on the same device under test using either the microprobe vendor calibration substrate or the custom-made standards show good correlation in the frequency bandwidth from 10 MHz up to 30 GHz.
  • Keywords
    calibration; printed circuit design; resistors; custom-made calibration standard; frequency 10 GHz to 30 GHz; microprobe based measurement; multilayer printed circuit board; multilayer substrate; resistor; solder bridge; two-tier calibration method; Bandwidth; Calibration; Nonhomogeneous media; Printed circuits; Probes; Standards; Substrates; Two-tier calibration; calibration standards; microprobes; multilayer printed circuit boards; vector network analyzer;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Conference (GeMIC), 2011 German
  • Conference_Location
    Darmstadt
  • Print_ISBN
    978-1-4244-9225-1
  • Electronic_ISBN
    978-3-9812668-3-2
  • Type

    conf

  • Filename
    5760793