• DocumentCode
    544785
  • Title

    Knowledge modelisation for brainstem auditory evoked potential interpretation: EPEXS

  • Author

    Brai, Amine ; Koutlidis, Régine ; Vibert, Jean-François

  • Author_Institution
    Unité de Recherche en Biomathématiques et Biostatistique, INSERM U263, B3E, Faculte de Médecine Saint-Antoine 27 rue Chaligny, F-75571 Paris Cedex 12, France
  • Volume
    6
  • fYear
    1992
  • fDate
    Oct. 29 1992-Nov. 1 1992
  • Firstpage
    2479
  • Lastpage
    2480
  • Abstract
    EPEXS is an expert system based on classification for evoked potentials analysis and interpretation (a medical examination performed in clinical neurophysiology laboratories), working from available clinical records and numerical data measured from the evoked potential traces. EPEXS integrates two formalisms of knowledge representation: rules and structured objects. The rules represent the elementary concepts (shallow knowledge) and include a model of possibility based on the Dubois and Prade´s default reasoning and possibility theory. The structured objects (prototypes) are organized as hierarchical taxonomies (underlying knowledge). They allow the description of both the objects and their relationships. The heuristics used to interpret the knowledge are based on two hypothesis: the unicity of the pathological process leading to several symptoms, and the progression from the general to the specific, leading to decide between the presence or absence of a class of diagnosis. This avoids the problem of the differential diagnosis. These various knowledges are used in a dynamical way that could be described as a four step process: acquisition of clinical data in order to define the nosological frame of the pathology, production of hypothesis about the nature and topography of lesions, interpretation of data in accordance with these hypothesis and finally evaluation of their likelihood.
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society, 1992 14th Annual International Conference of the IEEE
  • Conference_Location
    Paris, France
  • Print_ISBN
    0-7803-0785-2
  • Electronic_ISBN
    0-7803-0816-6
  • Type

    conf

  • DOI
    10.1109/IEMBS.1992.5761549
  • Filename
    5761549