DocumentCode :
545456
Title :
Entropy measure of XML schema document complexity metric
Author :
Thaw, Tin Zar ; Khin, Mie Mie
Author_Institution :
Univ. of Comput. Studies Mandalay, Mandalay, Myanmar
Volume :
2
fYear :
2011
fDate :
11-13 March 2011
Firstpage :
476
Lastpage :
479
Abstract :
Design of eXtensible Markup Language schema document (XSD) plays an extremely important role in software development process and needs to be quantified for ease of reusability and flexibility. In this paper, Entropy Measure of Complexity (EMC) metric is proposed. The EMC metric measures how element and attribute types of XSD are inheritance to one another. More EMC value leads to greater design complexity. On the other hand, greater complexity values imply that many types of elements and attributes in XSD may be reused and flexible. It is demonstrated with examples and validated theoretically and empirically through actual test cases.
Keywords :
XML; computational complexity; entropy; software metrics; software reusability; XML schema document; entropy measure of complexity metric; software development process; software flexibility; software reusability; Complexity theory; Electromagnetic compatibility; Entropy; Programming; Software measurement; XML; Entropy Measure; Software development process; XSD; complexity values;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Research and Development (ICCRD), 2011 3rd International Conference on
Conference_Location :
Shanghai
Print_ISBN :
978-1-61284-839-6
Type :
conf
DOI :
10.1109/ICCRD.2011.5764178
Filename :
5764178
Link To Document :
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