DocumentCode :
54696
Title :
Wideband and Low-Profile H-Plane Ridged SIW Horn Antenna Mounted on a Large Conducting Plane
Author :
Yun Zhao ; Zhongxiang Shen ; Wen Wu
Author_Institution :
JGMT, Nanjing Univ. of Sci. & Technol., Nanjing, China
Volume :
62
Issue :
11
fYear :
2014
fDate :
Nov. 2014
Firstpage :
5895
Lastpage :
5900
Abstract :
This communication presents a wide-band and low-profile H-plane horn antenna based on ridged substrate integrated waveguide (SIW) with a large conducting ground. The horn antenna is implemented in a single substrate with a thickness of 0.13 λ0 at the center frequency. Despite its low profile, the new H-plane horn antenna achieves a very wide bandwidth by employing an arc-shaped copper taper printed on the extended dielectric slab and a three-step ridged SIW transition. The ridged SIW is critical for widening the operation bandwidth and lowering the characteristic impedance so that an excellent impedance matching from the coaxial probe to the narrow SIW can be obtained over a wide frequency range. Measured VSWR of the fabricated horn antenna is below 2.5 from 6.6 GHz to 18 GHz. The antenna also exhibits stable radiation beam over the same frequency range. It is observed that measured results agree well with simulated ones.
Keywords :
UHF antennas; antenna radiation patterns; broadband antennas; horn antennas; impedance matching; ridge waveguides; slabs; substrate integrated waveguides; VSWR; antenna radiation beam; arc-shaped copper taper; characteristic impedance matching; coaxial probe; extended dielectric slab; frequency 2.5 GHz to 6.6 GHz; frequency 6.6 GHz to 18 GHz; large conducting plane; low-profile H-plane ridged SIW horn antenna; substrate integrated waveguide; three-step ridged SIW transition; wideband antenna; Antenna measurements; Apertures; Bandwidth; Dielectrics; Frequency measurement; Horn antennas; Probes; Horn antenna; ridge waveguide; substrate integrated waveguide; wideband antenna;
fLanguage :
English
Journal_Title :
Antennas and Propagation, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-926X
Type :
jour
DOI :
10.1109/TAP.2014.2354420
Filename :
6891293
Link To Document :
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