• DocumentCode
    547308
  • Title

    Digital logic simulation with compressed BDDs

  • Author

    Ubar, Raimund ; Mironov, Dmitri ; Devadze, Sergei ; Raik, Jaan ; Jutman, Artur

  • Author_Institution
    Tallinn Univ. of Technol., Tallinn, Estonia
  • Volume
    3
  • fYear
    2011
  • fDate
    10-12 June 2011
  • Firstpage
    105
  • Lastpage
    109
  • Abstract
    The complexity of today´s VLSI chip designs makes verification a necessary step before fabrication. As a result, gate-level logic simulation has become an integral component of the VLSI circuit design process which verifies the design and analyzes its behavior. Because of the continuous growth of the size and complexity of circuits, more efficient simulation methods are needed to keep the gate-level logic verification time acceptably small. In this paper a new algorithm for parallel logic simulation is proposed based on the Structurally Synthesized Multiple Input BDDs (SSMIBDD). SSMIBDDs allow significant model size reduction compared to the traditional gate-level approach, and higher speed of simulation. At the same time, the new model preserves structural information about the circuit, which is needed for processing of faults and analyzing timing issues and hazards in circuits.
  • Keywords
    VLSI; binary decision diagrams; circuit complexity; integrated circuit design; logic circuits; logic design; logic simulation; SSMIBDD; VLSI circuit design process; circuit complexity; compressed BDD; digital logic simulation; gate-level approach; gate-level logic simulation; gate-level logic verification time; model size reduction; parallel logic simulation; structurally synthesized multiple input BDD; Boolean functions; Circuit faults; Computational modeling; Data structures; Integrated circuit modeling; Logic gates; Solid modeling; binary decision diagrams; digital circuits; logic models; logic simulation; parallel simulation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Science and Automation Engineering (CSAE), 2011 IEEE International Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    978-1-4244-8727-1
  • Type

    conf

  • DOI
    10.1109/CSAE.2011.5952643
  • Filename
    5952643