DocumentCode
547832
Title
Hippocampal shape analysis in epilepsy using Laplace-Beltrami spectrum
Author
Shishegar, Rosita ; Soltanian-Zadeh, Hamid ; Moghadasi, Seyed Reza
Author_Institution
Control & Intell. Process. Centre of Excellence, Univ. of Tehran, Tehran, Iran
fYear
2011
fDate
17-19 May 2011
Firstpage
1
Lastpage
5
Abstract
Shape analysis plays an important role in many medical imaging studies. One of the recent shape analysis methods uses the Laplace Beltrami eigenvalues which is also used in this paper for global shape comparison of hippocampus of normal subjects and epileptic patients. Popularity of the Laplace Beltrami operator in this field is due to its isometry-invariance which avoids pre-processing steps like mapping, registration, and alignment. In addition, it is capable of revealing fine details in shapes that makes this method a good choice for deformation detecting purposes like epilepsy diagnosis. To examine capability of the proposed method, statistical analysis and two ways of classification, support vector machine (SVM) and finding out of normal range (ONR) subjects, are used. Moreover, to evaluate our classification results, K-fold cross-validation is performed. The best achieved results were true positive rate of 91.9% and false positive rate of 33.3%, yielded by ONR classifiers using 3 selected eigenvalues.
Keywords
brain; deformation; eigenvalues and eigenfunctions; image classification; medical image processing; patient diagnosis; shape recognition; statistical analysis; support vector machines; Laplace-Beltrami eigenvalues; Laplace-Beltrami spectrum; ONR classifier; SVM; deformation detection; epilepsy diagnosis; epileptic patients; global shape comparison; hippocampal shape analysis; isometry invariance; medical imaging; out of normal range; statistical analysis; support vector machine; Accuracy; Biomedical imaging; Eigenvalues and eigenfunctions; Epilepsy; Hippocampus; Shape; Support vector machines; Epilepsy; Global shape analysis; Hippocampus; K-fold Cross-validation; Laplace Beltrami Spectra; Statistical analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Engineering (ICEE), 2011 19th Iranian Conference on
Conference_Location
Tehran
Print_ISBN
978-1-4577-0730-8
Electronic_ISBN
978-964-463-428-4
Type
conf
Filename
5955721
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