• DocumentCode
    549181
  • Title

    Recursive joint decision and estimation based on generalized Bayes risk

  • Author

    Liu, Yu ; Li, X. Rong

  • Author_Institution
    Dept. of Electr. Eng., Univ. of New Orleans, New Orleans, LA, USA
  • fYear
    2011
  • fDate
    5-8 July 2011
  • Firstpage
    1
  • Lastpage
    8
  • Abstract
    Joint decision and estimation (JDE) is for solving problems involving inter-dependent decision and estimation and was proposed recently based on a generalized Bayes risk. The currently available JDE algorithm processes data in a batch manner. This batch method is computationally inefficient or infeasible for many dynamic JDE problems where measurements are made available sequentially. Therefore, this paper follows the same JDE framework based on the generalized Bayes risk and proposes a recursive version of the JDE algorithm, which fits the dynamic JDE problems more naturally and inherits JDE´s theoretical superiorities. Further, a joint performance measure in the measurement space is proposed for dynamic JDE problems. To the authors´ knowledge, this is the only performance evaluation framework currently available for JDE evaluation. Finally, an illustrative example of the recursive JDE algorithm is elaborated and numerical simulations comparing it with the traditional two-stage algorithms (i.e., decide-then-estimate and estimate-then-decide) are presented.
  • Keywords
    Bayes methods; decision theory; JDE evaluation; decide-then-estimate algorithm; estimate-then-decide algorithm; generalized Bayes risk; interdependent decision; numerical simulation; recursive JDE algorithm; recursive joint decision-estimation; Approximation methods; Estimation; Heuristic algorithms; Joints; Partitioning algorithms; Prediction algorithms; Time measurement; generalized Bayes risk; joint decision and estimation; performance evaluation; recursive;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Information Fusion (FUSION), 2011 Proceedings of the 14th International Conference on
  • Conference_Location
    Chicago, IL
  • Print_ISBN
    978-1-4577-0267-9
  • Type

    conf

  • Filename
    5977622