DocumentCode
549392
Title
Performance and reliability investigations of waveguide-integrated photodetectors
Author
Kroh, Marcel ; Beling, Andreas ; Trommer, Dirk ; Margraf, Michael ; Unterbörsch, Günter
Author_Institution
U2T Photonics AG, Berlin, Germany
fYear
2011
fDate
22-26 May 2011
Firstpage
1
Lastpage
4
Abstract
The reliability of 50 GHz waveguide-integrated photodetectors is studied under accelerated aging in standard high temperature tests and in additional reliability tests applying high optical input power onto the photodetectors. Based on the experimental data we determined lifetimes exceeding the requirements of telecom operators. No measureable performance degradation was found after 2000 hours high-temperature high-power stress conditions.
Keywords
ageing; integrated optics; optical communication equipment; optical waveguides; photodetectors; reliability; aging; high-temperature high-power stress conditions; high-temperature testing; reliability; telecom operators; waveguide-integrated photodetectors; Dark current; Optical pulses; Optical saturation; Optical waveguides; Photodetectors; Reliability; Temperature measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Compound Semiconductor Week (CSW/IPRM), 2011 and 23rd International Conference on Indium Phosphide and Related Materials
Conference_Location
Berlin
Print_ISBN
978-1-4577-1753-6
Electronic_ISBN
978-3-8007-3356-9
Type
conf
Filename
5978398
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