DocumentCode
549496
Title
Integrated circuit security techniques using variable supply voltage
Author
Wei, Sheng ; Potkonjak, Miodrag
Author_Institution
Comput. Sci. Dept., Univ. of California, Los Angeles, CA, USA
fYear
2011
fDate
5-9 June 2011
Firstpage
248
Lastpage
253
Abstract
This paper addresses integrated circuit (IC) security issues by using supply voltage based gate-level characterization (GLC). Our GLC scheme is capable of characterizing both manifestation and physical level properties of an IC accurately using variable supply voltage. We demonstrate that the proposed scheme can detect three types of IC attacks with low false positives and false negatives.
Keywords
integrated circuit testing; security of data; GLC scheme; IC; IC attacks; gate-level characterization; integrated circuit security techniques; variable supply voltage; Aging; Delay; Equations; Integrated circuits; Logic gates; Mathematical model; Security; Gate-level characterization; integrated circuit security; process variation; supply voltage control;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference (DAC), 2011 48th ACM/EDAC/IEEE
Conference_Location
New York, NY
ISSN
0738-100x
Print_ISBN
978-1-4503-0636-2
Type
conf
Filename
5981758
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