Title :
Integrated circuit security techniques using variable supply voltage
Author :
Wei, Sheng ; Potkonjak, Miodrag
Author_Institution :
Comput. Sci. Dept., Univ. of California, Los Angeles, CA, USA
Abstract :
This paper addresses integrated circuit (IC) security issues by using supply voltage based gate-level characterization (GLC). Our GLC scheme is capable of characterizing both manifestation and physical level properties of an IC accurately using variable supply voltage. We demonstrate that the proposed scheme can detect three types of IC attacks with low false positives and false negatives.
Keywords :
integrated circuit testing; security of data; GLC scheme; IC; IC attacks; gate-level characterization; integrated circuit security techniques; variable supply voltage; Aging; Delay; Equations; Integrated circuits; Logic gates; Mathematical model; Security; Gate-level characterization; integrated circuit security; process variation; supply voltage control;
Conference_Titel :
Design Automation Conference (DAC), 2011 48th ACM/EDAC/IEEE
Conference_Location :
New York, NY
Print_ISBN :
978-1-4503-0636-2
