• DocumentCode
    549517
  • Title

    WaveMin: A fine-grained clock buffer polarity assignment combined with buffer sizing

  • Author

    Joo, Deokjin ; Kim, Taewhan

  • Author_Institution
    Sch. of Electr. Eng. & Comput. Sci., Seoul Nat. Univ., Seoul, South Korea
  • fYear
    2011
  • fDate
    5-9 June 2011
  • Firstpage
    522
  • Lastpage
    527
  • Abstract
    The clock buffer polarity assignment is one of the effective design schemes to mitigate the power/ground noise caused by the clock signal propagation. This work overcomes two fundamental limitations of the conventional clock buffer polarity assignment methods, which are (1) the unawareness of the signal delay (i.e., arrival time) differences to the leaf buffering elements and (2) the ignorance of the effect of the current fluctuation of non-leaf buffering elements on the total peak current waveform. Clearly, not addressing (1) and (2) in polarity assignment may cause a severe inaccuracy on the peak current estimation, which results in unnecessarily high peak current. To overcome the limitations, we propose a completely new fine-grained approach to the clock buffer polarity assignment combined with buffer sizing, formulating the problem into a multi-objective shortest path problem and solving it effectively. The experimental results show that the proposed method is able to produce designs with 17% lower peak current and 20% lower power noise on average compared the results produced by the best ever known method.
  • Keywords
    buffer circuits; clocks; logic design; reliability; WaveMin; buffer sizing; fine grained approach; fine grained clock buffer polarity assignment; leaf buffering elements; nonleaf buffering element; peak current estimation; polarity assignment; signal delay; Approximation algorithms; Clocks; Inverters; Noise; Rails; Switches; Synchronization; Polarity assignment; buffer sizing; power/ground noise;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference (DAC), 2011 48th ACM/EDAC/IEEE
  • Conference_Location
    New York, NY
  • ISSN
    0738-100x
  • Print_ISBN
    978-1-4503-0636-2
  • Type

    conf

  • Filename
    5981852