DocumentCode :
549543
Title :
Universal logic modules based on double-gate carbon nanotube transistors
Author :
Zukoski, Andrew ; Yang, Xuebei ; Mohanram, Kartik
Author_Institution :
Dept. of Electr. & Comput. Eng., Rice Univ., Houston, TX, USA
fYear :
2011
fDate :
5-9 June 2011
Firstpage :
884
Lastpage :
889
Abstract :
Double-gate carbon nanotube field-effect transistors (DG-CNTFETs) can be controlled in the field to be either n-type or p-type through an extra polarity gate. This results in an embedded XOR behavior, which has inspired several novel circuit designs and architectures. This work makes the following contributions. First, we propose an accurate and efficient semi-classical modeling approach to realize the first SPICE-compatible model for circuit design and optimization of DG-CNTFETs. Second, we design and optimize universal logic modules (ULMs) in two circuit styles based on DG-CNTFETs. The proposed ULMs can leverage the full potential of the embedded XOR through the FPGA-centric lookup table optimization flow. Further, we demonstrate that DG-CNTFET ULMs in the double pass-transistor logic style, which inherently produces dual-rail outputs with balanced delay, are faster than DG-CNTFET circuits in the conventional single-rail static logic style that relies on explicit input inversion. On average across 12 benchmarks, the proposed dual-rail ULMs outperform the best DG-CNTFET fabrics based on tiling patterns by 37%, 12%, and 33% in area, delay, and total power, respectively.
Keywords :
carbon nanotubes; field effect transistors; logic gates; network synthesis; C; DG-CNTFET ULM; SPICE-compatible model; XOR behavior; circuit designs; double-gate carbon nanotube field-effect transistors; semiclassical modeling approach; universal logic module; CNTFETs; Computational modeling; Delay; Integrated circuit modeling; Logic gates; Optimization; Carbon nanotubes; double pass-transistor logic; double-gate; universal logic module;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference (DAC), 2011 48th ACM/EDAC/IEEE
Conference_Location :
New York, NY
ISSN :
0738-100x
Print_ISBN :
978-1-4503-0636-2
Type :
conf
Filename :
5981878
Link To Document :
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