DocumentCode :
549545
Title :
DRAIN: Distributed Recovery Architecture for Inaccessible Nodes in multi-core chips
Author :
DeOrio, Andrew ; Aisopos, Kostantinos ; Bertacco, Valeria ; Peh, Li-Shiuan
Author_Institution :
Univ. of Michigan, Ann Arbor, MI, USA
fYear :
2011
fDate :
5-9 June 2011
Firstpage :
912
Lastpage :
917
Abstract :
As transistor dimensions continue to scale deep into the nanometer regime, silicon reliability is becoming a chief concern. At the same time, transistor counts are scaling up, enabling the design of highly integrated chips with many cores and a complex interconnect fabric, often a network on chip (NoC). Particularly problematic is the case when the accumulation of permanent hardware faults leads to disconnected cores in the system. In order to maintain correct system operation, it is necessary to salvage the data from these isolated nodes. In this work, we introduce a recovery mechanism targeting precisely this issue: DRAIN (Distributed Recovery Architecture for Inaccessible Nodes) provides system-level recovery from permanent failures. When an error disconnects a node from the network, DRAIN uses emergency links to transfer architectural state and cached data from disconnected nodes to nearby connected caches. DRAIN incurs zero performance penalty during normal operation, and is compatible with any cache coherence protocol, interconnect topology or routing protocol. Experimental results show that DRAIN is able to provide complete state recovery within several milliseconds, on average, for a 1GHz 64-node CMP at an area overhead of only a few thousand gates.
Keywords :
computer architecture; fault tolerant computing; multiprocessing systems; network-on-chip; 1GHz 64-node CMP; DRAIN; Distributed Recovery Architecture for Inaccessible Nodes; cache coherence protocol; distributed recovery architecture; multicore chip; network on chip; recovery mechanism; routing protocol; silicon reliability; system level recovery; transfer architectural state; zero performance penalty; Hardware; Logic gates; Network topology; Radiation detectors; Reliability; Routing; Topology; Fault-Tolerance; Network-on-Chip; Recovery; Resilient Systems;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference (DAC), 2011 48th ACM/EDAC/IEEE
Conference_Location :
New York, NY
ISSN :
0738-100x
Print_ISBN :
978-1-4503-0636-2
Type :
conf
Filename :
5981885
Link To Document :
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