DocumentCode
549599
Title
Transaction level statistical analysis for efficient micro-architectural power and performance studies
Author
Copty, Eman ; Kamhi, Gila ; Novakovsky, Sasha
Author_Institution
Intel Corp., Haifa, Israel
fYear
2011
fDate
5-9 June 2011
Firstpage
351
Lastpage
356
Abstract
In general, we lack in EDA industry tools and automated solutions in μArchitectural domain. In this paper, we elaborate on our attempt to advance performance simulation based statistical analysis techniques. On one hand, we utilize the content knowledge of μArchitectural specification (e.g., explicit specification of the major transactions), and on the other hand, the statistical compact representation of the simulation trace. We name the compact statistical modeling of transaction level performance simulation traces, Magenta (Modeling Agent for Transactional Analysis). As demonstrated by industrial case studies, Magenta can effectively capture all the sample flows that are represented in the simulation trace that exhibit the transaction of interest in terms of μArchitectural events in a statistical event dependency graph. Our industrial experience shows that Magenta is an effective statistical model for μArchitectural performance verification and power/performance trade-off.
Keywords
electronic design automation; graph theory; integrated circuit modelling; statistical analysis; μArchitectural domain; μArchitectural specification; EDA industry tools; Magenta; automated solutions; compact statistical modeling; content knowledge; microarchitectural power; modeling agent for transactional analysis; statistical compact representation; statistical event dependency graph; transaction level performance simulation traces; transaction level statistical analysis; Analytical models; Computational modeling; Data models; Flow graphs; Monitoring; Performance analysis; Statistical analysis; Micro-architectural Simulation; Performance Verification; Statistical analysis and modeling;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference (DAC), 2011 48th ACM/EDAC/IEEE
Conference_Location
New York, NY
ISSN
0738-100x
Print_ISBN
978-1-4503-0636-2
Type
conf
Filename
5981955
Link To Document