Title :
Transaction based pre-to-post silicon validation
Author :
Singerman, Eli ; Abarbanel, Yael ; Baartmans, Sean
Abstract :
Intel´s move towards the SoC paradigm comes with a compelling requirement for shorter time-to-market. To address that, we need to make both pre and post silicon validation more efficient. In this paper we focus on post-si functional validation, which consumes an increasing share of the overall product development timeline. We present a coherent Pre-to-Post workflow that aims to improve productivity of post-si validation and debug by proper investment in design for debug / validation (DFx) and in test development during pre-si stages. In this workflow, a central transactions and events definition repository serves as the backbone across pre-Si and post-Si activities. The transaction spec guides DFx work in pre-Si as well as test suite preparation in order to make the post-Si validation work productive. Usage of micro-architectural events and transactions raises the level of abstraction, and can help in getting better productivy, manageability, reusability, and less error prone Post-Si validation work.
Keywords :
integrated circuit manufacture; productivity; system-on-chip; time to market; SOC; central transactions; microarchitectural events; pre to post silicon validation; product development timeline; silicon on chip; test suite preparation; time to market; transaction spec guides; IP networks; Instruments; Optimization; Productivity; Programming; Silicon; System-on-a-chip; DFx; Silicon Coverage; Silicon Debug; Test Suite Optimization; Transaction;
Conference_Titel :
Design Automation Conference (DAC), 2011 48th ACM/EDAC/IEEE
Conference_Location :
New York, NY
Print_ISBN :
978-1-4503-0636-2