• DocumentCode
    549659
  • Title

    Wear rate leveling: Lifetime enhancement of PRAM with endurance variation

  • Author

    Dong, Jianbo ; Zhang, Lei ; Han, Yinhe ; Wang, Ying ; Li, Xiaowei

  • Author_Institution
    Key Lab. of Comput. Syst. & Archit., Chinese Acad. of Sci., Beijing, China
  • fYear
    2011
  • fDate
    5-9 June 2011
  • Firstpage
    972
  • Lastpage
    977
  • Abstract
    The limited write endurance of phase change random access memory (PRAM) is one of the major obstacles for PRAM-based main memory. Wear leveling techniques were proposed to extend its lifetime by balancing writes traffic. Another important concern that need to be considered is endurance variation in PRAM chips. When different PRAM cells have distinct endurance, balanced writes will result in lifetime degradation due to the weakest cells. Instead of balancing writes traffic, in this paper we propose wear rate leveling (WRL), a variant of wear leveling, to balance wear rates (i.e., writes traffic/edudrance) of cells across the PRAM chip. After investigating writing behavior of applications and endurance variation, we propose an architecture-level WRL mechanism. Moreover, there is an important tradeoff between endurance improvement and swapping data volume. To co-optimize endurance and swapping, a novel algorithm, Max Hyper-weight Rematching, is proposed to maximize PRAM lifetime and minimize performance degradation. Experimental results show 19x endurance improvement to prior Wear Leveling.
  • Keywords
    phase change memories; wear; PRAM lifetime enhancement; PRAM-based main memory; architecture-level WRL mechanism; endurance variation; max hyper-weight rematching algorithm; phase change random access memory; wear rate leveling techniques; Complexity theory; Degradation; Phase change random access memory; Prediction algorithms; Programming; Systematics; Writing; PRAM endurance; wear leveling; wear rate leveling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference (DAC), 2011 48th ACM/EDAC/IEEE
  • Conference_Location
    New York, NY
  • ISSN
    0738-100x
  • Print_ISBN
    978-1-4503-0636-2
  • Type

    conf

  • Filename
    5982017