DocumentCode :
549659
Title :
Wear rate leveling: Lifetime enhancement of PRAM with endurance variation
Author :
Dong, Jianbo ; Zhang, Lei ; Han, Yinhe ; Wang, Ying ; Li, Xiaowei
Author_Institution :
Key Lab. of Comput. Syst. & Archit., Chinese Acad. of Sci., Beijing, China
fYear :
2011
fDate :
5-9 June 2011
Firstpage :
972
Lastpage :
977
Abstract :
The limited write endurance of phase change random access memory (PRAM) is one of the major obstacles for PRAM-based main memory. Wear leveling techniques were proposed to extend its lifetime by balancing writes traffic. Another important concern that need to be considered is endurance variation in PRAM chips. When different PRAM cells have distinct endurance, balanced writes will result in lifetime degradation due to the weakest cells. Instead of balancing writes traffic, in this paper we propose wear rate leveling (WRL), a variant of wear leveling, to balance wear rates (i.e., writes traffic/edudrance) of cells across the PRAM chip. After investigating writing behavior of applications and endurance variation, we propose an architecture-level WRL mechanism. Moreover, there is an important tradeoff between endurance improvement and swapping data volume. To co-optimize endurance and swapping, a novel algorithm, Max Hyper-weight Rematching, is proposed to maximize PRAM lifetime and minimize performance degradation. Experimental results show 19x endurance improvement to prior Wear Leveling.
Keywords :
phase change memories; wear; PRAM lifetime enhancement; PRAM-based main memory; architecture-level WRL mechanism; endurance variation; max hyper-weight rematching algorithm; phase change random access memory; wear rate leveling techniques; Complexity theory; Degradation; Phase change random access memory; Prediction algorithms; Programming; Systematics; Writing; PRAM endurance; wear leveling; wear rate leveling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference (DAC), 2011 48th ACM/EDAC/IEEE
Conference_Location :
New York, NY
ISSN :
0738-100x
Print_ISBN :
978-1-4503-0636-2
Type :
conf
Filename :
5982017
Link To Document :
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