Bridging design and manufacture of analog/mixed-signal circuits in advanced CMOS

Author

Feng, Jia ; Loke, Alvin L S ; Wee, Tin Tin ; Lackey, Chad O. ; Okada, Lynne A. ; Schwan, Christoph T. ; Mantei, Tilo ; Morgan, John H. ; Herden, Marc M. ; Cooper, Jeffrey G. ; Wu, Zhi-Yuan ; Goo, Jung-Suk ; Li, Xin ; Icel, Ali B. ; Bair, Larry A. ; Fische

Author_Institution

GLOBALFOUNDRIES, Sunnyvale, CA, USA

fYear

2011

fDate

14-16 June 2011

Firstpage

226

Lastpage

227

Abstract

We present device and circuit characterization resulting from technology/design co-development to improve the design and manufacture of analog/mixed-signal (AMS) circuits in processors. We introduce I_D-based MOSFET transconductance measurements and a new measurement of drain saturation margin at realistic analog biasing. We also describe routinely monitored scribe lane replicas of key AMS passives and circuits. Such measurements enable construction and validation of compact models better suited to AMS needs than those historically tailored for logic design.

Keywords

CMOS analogue integrated circuits; CMOS logic circuits; MOSFET; integrated circuit design; logic design; mixed analogue-digital integrated circuits; AMS circuits; AMS passives; MOSFET transconductance measurements; advanced CMOS; analog biasing; analog-mixed-signal circuits; circuit characterization; device characterization; drain saturation margin measurement; logic design; processors; technology-design codevelopment; Electrical resistance measurement; FETs; MOS devices; Resistance; Temperature measurement; USA Councils; Voltage measurement;

fLanguage

English

Publisher

ieee

Conference_Titel

VLSI Technology (VLSIT), 2011 Symposium on

Conference_Location

Honolulu, HI

ISSN

0743-1562

Print_ISBN

978-1-4244-9949-6

Type

conf

Filename

5984650