Title :
Bridging design and manufacture of analog/mixed-signal circuits in advanced CMOS
Author :
Feng, Jia ; Loke, Alvin L S ; Wee, Tin Tin ; Lackey, Chad O. ; Okada, Lynne A. ; Schwan, Christoph T. ; Mantei, Tilo ; Morgan, John H. ; Herden, Marc M. ; Cooper, Jeffrey G. ; Wu, Zhi-Yuan ; Goo, Jung-Suk ; Li, Xin ; Icel, Ali B. ; Bair, Larry A. ; Fische
Author_Institution :
GLOBALFOUNDRIES, Sunnyvale, CA, USA
Abstract :
We present device and circuit characterization resulting from technology/design co-development to improve the design and manufacture of analog/mixed-signal (AMS) circuits in processors. We introduce ID-based MOSFET transconductance measurements and a new measurement of drain saturation margin at realistic analog biasing. We also describe routinely monitored scribe lane replicas of key AMS passives and circuits. Such measurements enable construction and validation of compact models better suited to AMS needs than those historically tailored for logic design.
Keywords :
CMOS analogue integrated circuits; CMOS logic circuits; MOSFET; integrated circuit design; logic design; mixed analogue-digital integrated circuits; AMS circuits; AMS passives; MOSFET transconductance measurements; advanced CMOS; analog biasing; analog-mixed-signal circuits; circuit characterization; device characterization; drain saturation margin measurement; logic design; processors; technology-design codevelopment; Electrical resistance measurement; FETs; MOS devices; Resistance; Temperature measurement; USA Councils; Voltage measurement;
Conference_Titel :
VLSI Technology (VLSIT), 2011 Symposium on
Conference_Location :
Honolulu, HI
Print_ISBN :
978-1-4244-9949-6
