DocumentCode :
549717
Title :
A 1.4µA reset current phase change memory cell with integrated carbon nanotube electrodes for cross-point memory application
Author :
Liang, Jiale ; Jeyasingh, Rakesh Gnana David ; Chen, Hong-Yu ; Wong, H. -S Philip
Author_Institution :
Dept. of Electr. Eng., Stanford Univ., Stanford, CA, USA
fYear :
2011
fDate :
14-16 June 2011
Firstpage :
100
Lastpage :
101
Abstract :
A cross-point phase change memory (PCM) cell working close to its ultimate scaling limit is demonstrated for the first time with an ultra low reset current of 1.4μA and set current of 0.5μA. This is the lowest value ever reported. Carbon nanotubes (CNTs) are utilized as the bottom electrode of the cell, which bring the lithography-independent critical dimension down to 1.2 nm. Good electrical characteristics obtained demonstrate the functionality and potential viability of PCM for highly scaled ultra-dense memory at 2.5 nm node.
Keywords :
carbon nanotubes; lithography; phase change memories; CNT; cell electrode; cross-point PCM cell; cross-point memory application; current 0.5 muA; current 1.4 muA; electrical characteristics; highly-scaled ultradense memory; integrated carbon nanotube electrodes; lithography-independent critical dimension; phase change memory cell; potential viability; size 1.2 nm; size 2.5 nm; ultralow-reset current; Aluminum oxide; Electrodes; Phase change materials; Random access memory; Resistance; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Technology (VLSIT), 2011 Symposium on
Conference_Location :
Honolulu, HI
ISSN :
0743-1562
Print_ISBN :
978-1-4244-9949-6
Type :
conf
Filename :
5984659
Link To Document :
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