• DocumentCode
    549721
  • Title

    Design challenges of low-power and high-speed memory interface in advanced CMOS technology

  • Author

    Frans, Yohan ; Schmitt, Ralf ; Nguyen, Nhat ; Bhardwaj, Sunil ; Bronner, Gary

  • Author_Institution
    Rambus Inc., Sunnyvale, CA, USA
  • fYear
    2011
  • fDate
    14-16 June 2011
  • Firstpage
    110
  • Lastpage
    111
  • Abstract
    Design requirements for low-power and high-speed memory interfaces in mobile systems are discussed within the context of CMOS process scaling. Key challenges include process variations, low Vdd/Vth ratio, interconnect parasitics, and model accuracy of key process parameters. It is shown that careful system architecture along with appropriate circuit techniques allow mobile memory interface to meet aggressive performance and power targets with conventional technology.
  • Keywords
    CMOS memory circuits; integrated circuit design; integrated circuit interconnections; low-power electronics; mobile radio; CMOS process scaling; advanced CMOS technology; design requirements; high-speed memory interface; interconnect parasitics; low-power memory interface; mobile systems; process variations; Capacitance; Clocks; Memory management; Mobile communication; Process control; Random access memory; Wires;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Technology (VLSIT), 2011 Symposium on
  • Conference_Location
    Honolulu, HI
  • ISSN
    0743-1562
  • Print_ISBN
    978-1-4244-9949-6
  • Type

    conf

  • Filename
    5984664