DocumentCode :
549723
Title :
High performance graphene FETs with self-aligned buried gates fabricated on scalable patterned ni-catalyzed graphene
Author :
Wang, Yanjie ; Huang, Bo-Chao ; Zhang, Ming ; Miao, Congqin ; Xie, Ya-Hong ; Woo, Jason C S
Author_Institution :
Dept. of Electr. Eng., UCLA, Los Angeles, CA, USA
fYear :
2011
fDate :
14-16 June 2011
Firstpage :
116
Lastpage :
117
Abstract :
For the first time, we report a scalable technique to fabricate graphene transistors with self-aligned buried gates process. The high performance buried-gate graphene transistor has excellent field-effect mobility of 6,100cm2/V·s and 24,000 cm2/V·s before and after subtraction of contact resistance. To the best of our knowledge, this is the highest room temperature mobility for CVD graphene FETs reported to date. This result paves the way for manufacturable high quality graphene transistor technology.
Keywords :
chemical vapour deposition; contact resistance; field effect transistors; graphene; nickel; CVD graphene FET; Ni; contact resistance; field-effect mobility; graphene transistors; high-performance graphene FET; high-quality graphene transistor technology; room temperature mobility; scalable patterned nickel-catalyzed graphene; self-aligned buried gate process; Contact resistance; Etching; FETs; Logic gates; Nickel; buried gate; graphene; self-aligned; transistor;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Technology (VLSIT), 2011 Symposium on
Conference_Location :
Honolulu, HI
ISSN :
0743-1562
Print_ISBN :
978-1-4244-9949-6
Type :
conf
Filename :
5984667
Link To Document :
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