• DocumentCode
    54976
  • Title

    Capacitance Calculation for Via Structures Using an Integral Equation Method Based on Partial Capacitance

  • Author

    Hanfeng Wang ; Siming Pan ; Jingook Kim ; Ruehli, Albert E. ; Jun Fan

  • Author_Institution
    EMC Lab., Missouri Univ. of Sci. & Technol., Rolla, MO, USA
  • Volume
    3
  • Issue
    12
  • fYear
    2013
  • fDate
    Dec. 2013
  • Firstpage
    2134
  • Lastpage
    2146
  • Abstract
    In this paper, a new integral equation formulation for via structures is developed for the capacitance extraction between vias and planes. The formulation is initially developed for axially symmetric geometries and then extended to axially asymmetric geometries by changing the circular ring cells to arc cells. The extended method can be used to calculate the shared-antipad via structure, which is widely used in high-speed differential signal interconnects. In addition, the image theory is used to handle inhomogeneous media, and a new technique is given to reduce computational costs for via-to-plane structures based on properties of the capacitance-matrix elements. The proposed method is validated with a commercial finite element method-based tool for several practical via structures. The extracted capacitance is also incorporated into the physics-based via model and validated with full-wave simulations.
  • Keywords
    capacitance measurement; costing; finite element analysis; image processing; integral equations; printed circuit testing; axially symmetric geometries; capacitance calculation; capacitance extraction; capacitance-matrix elements; circular ring cells; computational costs; extracted capacitance; finite element method; full-wave simulations; high-speed differential signal interconnects; image theory; integral equation method; partial capacitance; physics-based via model; shared-antipad; via structures; Capacitance; Conductors; Geometry; Green´s function methods; Integral equations; Integrated circuit modeling; Printed circuits; Equation method; image theory; integral shared-antipad; partial capacitance; via-to-plane capacitance;
  • fLanguage
    English
  • Journal_Title
    Components, Packaging and Manufacturing Technology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    2156-3950
  • Type

    jour

  • DOI
    10.1109/TCPMT.2013.2272323
  • Filename
    6566102