Title :
Dynamic performance stubs to simulate the main memory behavior of applications
Author :
Trapp, Peter ; Meyer, Markus ; Facchi, Christian
Author_Institution :
Univ. of Appl. Sci., Ingolstadt, Ingolstadt, Germany
Abstract :
Dynamic performance stubs provide a framework to simulate the performance behavior of software modules and functions. Hence, they can be used as an extension to software performance engineering methodologies. The methodology of dynamic performance stubs targets to gain oriented performance improvement. Other applications include the identification of "hidden" bottlenecks and the prioritization of optimization alternatives. Main memory stubs have been developed to extend the simulation possibilities of the dynamic performance stubs framework. They are able to simulate the heap and stack behavior of software modules or functions. This paper evaluates an algorithm to generate the simulation data file, which serves as input for the main memory stubs simulation algorithm. Moreover, it presents an automatic error correction algorithm to consider the results from the calibration functions to improve the simulation results. Additionally, a proof of concept is given to depict the results of the simulation data file generation and the automatic error correction algorithm. This paper shows that, it is possible to generate the simulation data file as well as to optimize the simulation data to compensate inaccuracies in order to create main memory stubs.
Keywords :
optimisation; software performance evaluation; storage management; automatic error correction; calibration functions; dynamic performance stubs; main memory behavior; optimization; performance behavior; performance improvement; software functions; software modules; software performance engineering; Bounds; Case Studies; Evaluation and Testing; Memory Systems; Modeling; Models; Performance Optimization; Software Performance;
Conference_Titel :
Performance Evaluation of Computer & Telecommunication Systems (SPECTS), 2011 International Symposium on
Conference_Location :
The Hague
Print_ISBN :
978-1-4577-0139-9
Electronic_ISBN :
978-1-61782-309-1