• DocumentCode
    549840
  • Title

    4-times faster rising VPASS (10V), 15% lower power VPGM (20V), wide output voltage range voltage generator system for 4-times faster 3D-integrated solid-state drives

  • Author

    Hatanaka, Teruyoshi ; Takeuchi, Ken

  • Author_Institution
    Univ. of Tokyo, Tokyo, Japan
  • fYear
    2011
  • fDate
    15-17 June 2011
  • Firstpage
    200
  • Lastpage
    201
  • Abstract
    A wide output voltage, VOUT, range from 10V to 20V voltage generator system is proposed for the 3D-integrated NAND flash Solid-State Drives, SSDs. The circuits are fabricated with the smart mix and match of the 0.18um standard CMOS, the low voltage and high voltage NAND flash memory technologies. The two-stage boost converter is proposed for the program pass voltage, VPASS, in the lower VOUT, 10V, and the heavy load capacitance, COUT, condition. The measured rising time is four times shorter than the conventional single-stage boost converter. In addition, the constant current boosting scheme is proposed for the program voltage, VPGM, in the higher VOUT, 20V, and the light COUT condition. The power consumption decreases by 15%. As a result, the SSD performance improves by 4 times.
  • Keywords
    CMOS digital integrated circuits; NAND circuits; flash memories; low-power electronics; power convertors; three-dimensional integrated circuits; 3D-integrated NAND flash solid-state drives; lower power VPGM; single-stage boost converter; size 0.18 mum; standard CMOS; two-stage boost converter; voltage 10 V to 20 V; wide output voltage range voltage generator system; Boosting; Energy measurement; Flash memory; Generators; Inductors; Semiconductor device measurement; Time measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Circuits (VLSIC), 2011 Symposium on
  • Conference_Location
    Honolulu, HI
  • ISSN
    2158-5601
  • Print_ISBN
    978-1-61284-175-5
  • Type

    conf

  • Filename
    5986104