DocumentCode
551376
Title
Improvement of the sensitivity and operating range of MEMS-based resistive-type vacuum gauges
Author
Punchihewa, K.G. ; Zaker, E. ; Kuljic, R. ; Rangaraj, A. ; Liu, M. ; Purahmad, M. ; Saboonchi, H. ; Vesa, A. ; Gezahegne, G. ; Hughes, C. ; Humayun, Md ; Huang, J. ; Padmanabhan, A. ; Seethapathy, S. ; Shelton, J. ; Hsu, B. ; Prabhakar, A. ; Jendo, M. ; S
Author_Institution
Dept. of Electr. & Comput. Eng., Univ. of Illinois at Chicago, Chicago, IL, USA
fYear
2011
fDate
18-22 July 2011
Firstpage
191
Lastpage
192
Abstract
MEMS-based Pirani gauges consisting of 20 nm/200 nm Cr/Au meander-shaped resistor elements have been fabricated on 1 μm thick silicon nitride diaphragms. The distances d from the resistor elements to the cold junctions were 54, 340, and 1200 μm. The 54 μm device operates in a pressure range from about 0.05 to 5 Torr and the 1200 μm device from 0.003 to 0.3 Torr. By connecting the two devices in series, the combined device operates in a range from 0.005 to 5 Torr. This concept can be extended to higher operating ranges by changing the dimensions of the diaphragms. The sensitivity of the devices is strongly influenced by the thermal resistances of the metal lines and the silicon diaphragms.
Keywords
diaphragms; micromechanical devices; resistors; sensitivity analysis; vacuum gauges; MEMS-based Pirani gauges; MEMS-based resistive-type vacuum gauges; cold junctions; meander-shaped resistor elements; operating range; sensitivity range; silicon nitride diaphragms; Junctions; Metals; Resistors; Sensitivity; Silicon; Thermal resistance; MEMS-based vacuum gauges; Miniaturized vacuum gauges; miniaturized Pirani gauges; miniaturized thermal vacuum gauges; vacuum pressure measurements;
fLanguage
English
Publisher
ieee
Conference_Titel
Vacuum Nanoelectronics Conference (IVNC), 2011 24th International
Conference_Location
Wuppertal
ISSN
pending
Print_ISBN
978-1-4577-1243-2
Electronic_ISBN
pending
Type
conf
Filename
6004627
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