• DocumentCode
    5515
  • Title

    A Wide-Range PLL Using Self-Healing Prescaler/VCO in 65-nm CMOS

  • Author

    I-Ting Lee ; Yun-Ta Tsai ; Shen-Iuan Liu

  • Author_Institution
    Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
  • Volume
    21
  • Issue
    2
  • fYear
    2013
  • fDate
    Feb. 2013
  • Firstpage
    250
  • Lastpage
    258
  • Abstract
    The variability and leakage current in nanoscale CMOS technology may degrade the circuit performances significantly. To accommodate the above issues in a wide-range phase-locked loop (PLL), a self-healing prescaler, a self-healing voltage-controlled oscillator (VCO), and a calibrated charge pump (CP) are presented. This PLL is fabricated in a 65-nm CMOS technology and its active area is 0.0182 mm2 . For the self-healing VCO, its measured frequency range is from 60 to 1489 MHz. When this PLL operates at 855 MHz, the measured rms and peak-to-peak jitters are 8.03 and 55.6 ps, respectively. The measured reference spur is -52.89 dBc. This PLL consumes 4.3 mW from 1.2 V supply without buffers.
  • Keywords
    CMOS analogue integrated circuits; UHF integrated circuits; UHF oscillators; charge pump circuits; phase locked loops; voltage-controlled oscillators; calibrated charge pump; frequency 60 MHz to 1489 MHz; nanoscale CMOS technology; peak-to-peak jitters; power 4.3 mW; self-healing prescaler; self-healing prescaler-VCO; self-healing voltage-controlled oscillator; size 65 nm; voltage 1.2 V; wide-range PLL; wide-range phase-locked loop; Current measurement; Detectors; Leakage current; Logic gates; Phase locked loops; Transistors; Voltage-controlled oscillators; Leakage current; nanoscale CMOS technology; phased-locked loop (PLL);
  • fLanguage
    English
  • Journal_Title
    Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1063-8210
  • Type

    jour

  • DOI
    10.1109/TVLSI.2012.2186990
  • Filename
    6164303