DocumentCode
5515
Title
A Wide-Range PLL Using Self-Healing Prescaler/VCO in 65-nm CMOS
Author
I-Ting Lee ; Yun-Ta Tsai ; Shen-Iuan Liu
Author_Institution
Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
Volume
21
Issue
2
fYear
2013
fDate
Feb. 2013
Firstpage
250
Lastpage
258
Abstract
The variability and leakage current in nanoscale CMOS technology may degrade the circuit performances significantly. To accommodate the above issues in a wide-range phase-locked loop (PLL), a self-healing prescaler, a self-healing voltage-controlled oscillator (VCO), and a calibrated charge pump (CP) are presented. This PLL is fabricated in a 65-nm CMOS technology and its active area is 0.0182 mm2 . For the self-healing VCO, its measured frequency range is from 60 to 1489 MHz. When this PLL operates at 855 MHz, the measured rms and peak-to-peak jitters are 8.03 and 55.6 ps, respectively. The measured reference spur is -52.89 dBc. This PLL consumes 4.3 mW from 1.2 V supply without buffers.
Keywords
CMOS analogue integrated circuits; UHF integrated circuits; UHF oscillators; charge pump circuits; phase locked loops; voltage-controlled oscillators; calibrated charge pump; frequency 60 MHz to 1489 MHz; nanoscale CMOS technology; peak-to-peak jitters; power 4.3 mW; self-healing prescaler; self-healing prescaler-VCO; self-healing voltage-controlled oscillator; size 65 nm; voltage 1.2 V; wide-range PLL; wide-range phase-locked loop; Current measurement; Detectors; Leakage current; Logic gates; Phase locked loops; Transistors; Voltage-controlled oscillators; Leakage current; nanoscale CMOS technology; phased-locked loop (PLL);
fLanguage
English
Journal_Title
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher
ieee
ISSN
1063-8210
Type
jour
DOI
10.1109/TVLSI.2012.2186990
Filename
6164303
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