DocumentCode :
551792
Title :
Study on reflection selective structure on near infrared
Author :
Yizhou, Li ; Daorong, Wang ; Jiaqi, Liu ; Hongjie, Li ; Juyan, Zhao
Author_Institution :
Nat. Key Lab. of Sci. & Technol. on Test Phys. & Numerical Math., Beijing, China
Volume :
2
fYear :
2011
fDate :
29-31 July 2011
Abstract :
The paper bring forward a design of multilayer structure which has a high reflectivity for 1.82μm laser beam and a high absorptivity for 1.48μm laser beam. The experiment reveal that the absorptivity of the film reach to 95% at incidence angle from 0° to 40° for 1.48μm laser beam and has a high reflectivity for 1.82μm high power laser at incidence angle of 30° at laser power density above 500w/cm2.
Keywords :
infrared spectra; laser materials processing; light absorption; optical design techniques; optical multilayers; reflectivity; film absorptivity; film reflectivity; laser beam; laser power density; multilayer structure; near infrared spectra; reflection selective structure; wavelength 1.48 mum; wavelength 1.82 mum; Laser beams; Laser theory; Optical reflection; Near infrared laser; Reflection selective;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics and Optoelectronics (ICEOE), 2011 International Conference on
Conference_Location :
Dalian
Print_ISBN :
978-1-61284-275-2
Type :
conf
DOI :
10.1109/ICEOE.2011.6013220
Filename :
6013220
Link To Document :
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