DocumentCode
551847
Title
Investigation of the effect of the ESD to the transient voltage suppressor
Author
Wang, Zhenxing ; Wu, Zhancheng ; Zhang, Xijun ; Cao, Yanbin
Author_Institution
Electrostatic & Electromagn. Protection Res. Inst., Shijiazhuang Mech. Eng. Collage, Shijiazhuang, China
Volume
3
fYear
2011
fDate
29-31 July 2011
Abstract
The transient voltage suppressor (TVS) is commonly used in circuit in order to protect the circuit from the Electrostatic Discharge (ESD). In this paper, the turn on voltage and the clamping voltage of the TVS device is tested to figure the capability of the device. The test shows the clamping voltage increase as the test voltage increase. After injected the BMM pulses, the internal of device was damaged. Both the turn on voltage and the clamping voltage of the TVS device would increase, and the protect capability of the TVS device decreased.
Keywords
electrostatic discharge; surge protection; transients; ESD; clamping voltage; electrostatic discharge; transient voltage suppressor; turn on voltage; CMOS integrated circuits; Electrostatic discharge; Generators; Junctions; Reliability; BMM; ESD; TLP; TVS;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics and Optoelectronics (ICEOE), 2011 International Conference on
Conference_Location
Dalian
Print_ISBN
978-1-61284-275-2
Type
conf
DOI
10.1109/ICEOE.2011.6013319
Filename
6013319
Link To Document