Title :
Wavelength tolerance of an all-optical multi-logic gate based on XPM in a HNLF
Author :
Qiu, Jifang ; Yin, Zuoshan ; Sun, Kai ; Chen, Lawrence R. ; Rochette, Martin ; Wu, Jian ; Zhao, Lingjuan ; Wang, Wei
Author_Institution :
Inst. of Semicond., Chinese Acad. of Sci., Beijing, China
Abstract :
We investigate the wavelength-dependent performance of an all-optical multi-logic gate based on XPM. Simulation results show that this scheme is applicable over the whole C-band when the wavelength separation is between 4nm and 33nm.
Keywords :
nonlinear optics; optical logic; optical modulation; HNLF; XPM; all-optical multilogic gate; wavelength 4 nm to 33 nm; wavelength separation; wavelength tolerance; Adaptive optics; Logic gates; Modulation; Optical sensors;
Conference_Titel :
Opto-Electronics and Communications Conference (OECC), 2011 16th
Conference_Location :
Kaohsiung
Print_ISBN :
978-1-61284-288-2
Electronic_ISBN :
978-986-02-8974-9
