• DocumentCode
    552389
  • Title

    Twin gate, vertical slit FET (VeSFET) for highly periodic layout and 3D integration

  • Author

    Maly, W. ; Singh, N. ; Chen, Z. ; Shen, N. ; Li, X. ; Pfitzner, A. ; Kasprowicz, D. ; Kuzmicz, W. ; Lin, Y-W ; Marek-Sadowska, M.

  • Author_Institution
    ECE Dept., Carnegie Mellon Univ., Pittsburgh, PA, USA
  • fYear
    2011
  • fDate
    16-18 June 2011
  • Firstpage
    145
  • Lastpage
    150
  • Abstract
    This paper introduces a new device architecture, which can be shared by a variety of different types of transistors including a new 3D junctionless N-channel and P-channel vertical slit FET (VeSFET). VeSFETs have two symmetrical independent gates that provide many new circuit level opportunities e.g. in energy conservation domain, unavailable otherwise. The key feature of the new architecture is its extreme regularity, which promotes highly repetitive layouts, constructed with small number of massively replicated simple geometrical patterns vastly simplifying critical lithography steps. A single layer of VeSFETs is a canvas for Vertical Slit Transistor based Integrated Circuits (VeSTICs) [2,3]. This paper discusses the basic idea of vertical slit device architecture, the physics of VeSFETs, their key electrical properties in comparison with trigate FinFETs, and shows experimental characteristics of fabricated devices.
  • Keywords
    MOS integrated circuits; MOSFET; integrated circuit layout; three-dimensional integrated circuits; 3D integration; 3D junctionless VeSFET; electrical property; highly periodic layout; twin gate vertical slit FET; vertical slit device architecture; vertical slit transistor based integrated circuit; Capacitance; FinFETs; Logic gates; Performance evaluation; Silicon; Three dimensional displays; 3D transistor; FinFET; SOI; VeSFET; VeSTICs; junctionless; layout regularity; trigate; twin gate;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Mixed Design of Integrated Circuits and Systems (MIXDES), 2011 Proceedings of the 18th International Conference
  • Conference_Location
    Gliwice
  • Print_ISBN
    978-1-4577-0304-1
  • Type

    conf

  • Filename
    6016050