DocumentCode :
552440
Title :
Improved feature selection based on scatter degree
Author :
Zare, Arman ; Fouladi, Seyyed Hamed
Author_Institution :
Dept. of Electron. Eng., Amirkabir Univ., Tehran, Iran
Volume :
1
fYear :
2011
fDate :
10-13 July 2011
Firstpage :
97
Lastpage :
101
Abstract :
Feature reduction is important in machine learning, data mining and pattern recognition fields. Feature reduction consists of two methods: 1. Feature Extraction 2. Feature Selection. Feature selection methods try to select feature subset from feature set. Thus high dimension documents are projected on to lower dimension documents. The goal is selection of best subset that causes minimum error in classification. Scatter degree is one of the feature selection methods which attributes a degree of scattering for each feature. Features are selected that have higher scatter degree. In this paper, classification error has been reduced by considering other aspects in computing scatter degree (Improved Scatter Degree). Obtained results from this method have been compared with Scatter degree method.
Keywords :
data mining; document handling; feature extraction; learning (artificial intelligence); pattern classification; classification error; data mining; feature extraction; feature reduction; feature selection methods; improved feature selection; machine learning; pattern recognition; scatter degree; Algorithm design and analysis; Cybernetics; Equations; Feature extraction; Machine learning; Mathematical model; Principal component analysis; Feature selection; Pattern recognition; Scatter degree;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Machine Learning and Cybernetics (ICMLC), 2011 International Conference on
Conference_Location :
Guilin
ISSN :
2160-133X
Print_ISBN :
978-1-4577-0305-8
Type :
conf
DOI :
10.1109/ICMLC.2011.6016668
Filename :
6016668
Link To Document :
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