Direct Comparison of Josephson Voltage Standards at 10 V Between BIPM and CENAM

Author

Aviles, David ; Navarrete, Enrique ; Hernandez, D. ; Solve, S. ; Chayramy, R.

Author_Institution

Centro Nac. de Metrol., Querétaro, France

Volume

62

Issue

6

fYear

2013

fDate

Jun-13

Firstpage

1640

Lastpage

1645

Abstract

A direct comparison of Josephson voltage standards at 10 V between the Bureau International des Poids et Mesures (BIPM) and the Centro Nacional de Metrología (CENAM), México, was carried out in September 2011. This comparison is part of the BIPM key comparisons (BIPM.EM-K10.b) and took place in the new DC Voltage Laboratory of CENAM. Both systems were very stable during the comparison, and the type “A” uncertainty was very low. The relative voltage difference between the two quantum standards was -6 parts in 10¹¹ ( -0.6 nV), with a combined uncertainty of 7 parts in 10¹¹ (0.7 nV).

Keywords

measurement standards; measurement uncertainty; voltage measurement; BIPM; Bureau International des Poids et Mesures; CENAM; Centro Nacional de Metrología; DC Voltage Laboratory; Josephson voltage standard; México; measurement uncertainty; quantum standard; relative voltage difference; voltage -0.6 nV; voltage 0.7 nV; voltage 10 V; Detectors; Frequency measurement; Microwave measurements; Radiation detectors; Standards; Uncertainty; Voltage measurement; DC voltage measurement; DC voltage standard measurements; JVS comparison; Josephson voltage standard (JVS); standards comparison;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/TIM.2012.2228752

Filename

6461412