DocumentCode :
553432
Title :
Short fail-safe capability and fault diagnosis strategies dedicated to a reconfigurable 5-level double-boost PFC
Author :
Thi Thuy Linh Pham ; Richardeau, Frederic ; Gateau, Guillaume
Author_Institution :
Lab. Plasma et Conversion d´Energie; ENSEEIHT, Univ. de Toulouse, Toulouse, France
fYear :
2011
fDate :
Aug. 30 2011-Sept. 1 2011
Firstpage :
1
Lastpage :
10
Abstract :
A new 5-level reconfigurable PFC topology with low energy short-failure capability and fast fault-diagnosis is proposed. It includes a 2-stacked low energy 3-level Fly-Cap Boost through two input low frequency rectifiers. 600V-30kHz devices in series pear stack allow one short-fault for transistor and up to two short-faults for diodes. Firstly, authors shows for the first time the low ageing drift and the great stability of the parasite short-failure resistance (Rsc) of failed CoolMos™ transistors and SiC diodes inside well known epoxy molded package (TO220/TO247/TO3P cases). Secondly, two fault-diagnosis strategies are presented: one directly monitors the voltages across the flying capacitors to detect and to localize the faulty switch by means of two sensors; other is based on a harmonic detection (magnitude and phase-shift) at the switching frequency through only one voltage sensor at the input of the PFC. All these strategies are analyzed and simulated with the efficient PD-PWM technique that exhibits a lower THD of the leg-leg input voltage for three-phase application. The design and the most important features are highlighted thanks to a digital control frame and a single-phase mock-up rated to AC115V-DC400V - 4kW-4×31kHz.
Keywords :
PWM rectifiers; electric sensing devices; failure analysis; fault diagnosis; fault tolerance; harmonic distortion; power capacitors; power factor correction; power semiconductor diodes; power transistors; silicon compounds; wide band gap semiconductors; 2-stacked low energy 3-level fly-cap boost; CoolMos transistor; PD-PWM technique; SiC; THD; digital control frame; energy short fail-safe capability; epoxy molded packaging; fault diagnosis strategy; faulty switch localization; flying capacitor; frequency 30 kHz; harmonic detection; input low frequency rectifier; leg-leg input voltage; low ageing drift; parasite short-failure resistance; power 4 kW; reconfigurable 5-level double-boost PFC topology; series pear stack; short-fault diode; short-fault transistor; switching frequency; voltage 115 V; voltage 400 V; voltage 600 V; voltage sensor; Aging; Capacitors; Electric breakdown; Sensors; Switches; Topology; Voltage control; Diagnostics; Fault Tolerance; Multilevel Converter; Power Factor Correction;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Electronics and Applications (EPE 2011), Proceedings of the 2011-14th European Conference on
Conference_Location :
Birmingham
Print_ISBN :
978-1-61284-167-0
Electronic_ISBN :
978-90-75815-15-3
Type :
conf
Filename :
6020289
Link To Document :
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