Title :
Gatecard reliability prediction analysis
Author :
Somesha, S. ; Lee, D.N. ; Loddick, S.J.
Author_Institution :
Converteam Uk Ltd., Rugby, UK
fDate :
Aug. 30 2011-Sept. 1 2011
Abstract :
The theoretical reliability of Printed Circuit Boards (PCBs) has been compared to actual failure rates, and used to demonstrate the improved accuracy of the parts stress over the simpler parts count approach. The methodology is then extended to demonstrate an expected reliability improvement of Active Stator drives versus equivalent voltage source drives.
Keywords :
circuit reliability; printed circuits; variable speed drives; PCB; active stator drives; equivalent voltage source drives; gatecard reliability prediction analysis; printed circuit boards; Insulated gate bipolar transistors; Integrated circuit reliability; Logic gates; Predictive models; Reliability theory; Stress; Gatecards; Reliability prediction;
Conference_Titel :
Power Electronics and Applications (EPE 2011), Proceedings of the 2011-14th European Conference on
Conference_Location :
Birmingham
Print_ISBN :
978-1-61284-167-0
Electronic_ISBN :
978-90-75815-15-3
