• DocumentCode
    553501
  • Title

    Gatecard reliability prediction analysis

  • Author

    Somesha, S. ; Lee, D.N. ; Loddick, S.J.

  • Author_Institution
    Converteam Uk Ltd., Rugby, UK
  • fYear
    2011
  • fDate
    Aug. 30 2011-Sept. 1 2011
  • Firstpage
    1
  • Lastpage
    10
  • Abstract
    The theoretical reliability of Printed Circuit Boards (PCBs) has been compared to actual failure rates, and used to demonstrate the improved accuracy of the parts stress over the simpler parts count approach. The methodology is then extended to demonstrate an expected reliability improvement of Active Stator drives versus equivalent voltage source drives.
  • Keywords
    circuit reliability; printed circuits; variable speed drives; PCB; active stator drives; equivalent voltage source drives; gatecard reliability prediction analysis; printed circuit boards; Insulated gate bipolar transistors; Integrated circuit reliability; Logic gates; Predictive models; Reliability theory; Stress; Gatecards; Reliability prediction;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Electronics and Applications (EPE 2011), Proceedings of the 2011-14th European Conference on
  • Conference_Location
    Birmingham
  • Print_ISBN
    978-1-61284-167-0
  • Electronic_ISBN
    978-90-75815-15-3
  • Type

    conf

  • Filename
    6020359
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=553501