Title :
Stochastic model in eddy current Non Destructive Testing
Author :
Homberg, C. ; Henneron, Thomas ; Clenet, S.
Author_Institution :
L2EP, ParisTech Arts et Metiers, Lille, France
fDate :
Aug. 30 2011-Sept. 1 2011
Abstract :
In Non Destructive Testing (NDT), the system to scan experiences mechanical and thermal constraints. The shape of crack in the system can not be predicted. A stochastic model for the shape of the crack has been combined with a numerical model based on the solution of the Maxwell equations in quasistatics using the finite element method. In these conditions, a Monte Carlo Simulation Method has been introduced in a magnetoharmonic formulation used to solve a NDT problem.
Keywords :
Maxwell equations; Monte Carlo methods; cracks; eddy current testing; finite element analysis; stochastic processes; Maxwell equations; Monte Carlo Simulation; crack; eddy current testing; finite element method; magnetoharmonic formulation; mechanical constraints; nondestructive testing; numerical model; quasistatics; stochastic model; thermal constraints; Eddy currents; Finite element methods; Magnetic domains; Numerical models; Shape; Stochastic processes; Stress; Device simulation; Diagnostics; Modelling;
Conference_Titel :
Power Electronics and Applications (EPE 2011), Proceedings of the 2011-14th European Conference on
Conference_Location :
Birmingham
Print_ISBN :
978-1-61284-167-0
Electronic_ISBN :
978-90-75815-15-3
