Title :
Lifetime calculation for power modules, application and theory of models and counting methods
Author :
Mainka, K. ; Thoben, M. ; Schilling, O.
Author_Institution :
Infineon Technol. AG, Warstein, Germany
fDate :
Aug. 30 2011-Sept. 1 2011
Abstract :
Various counting methods are applied to extract amplitude, duration and number of thermal cycles from a mission profile. The objective of this paper is to compare different cycle counting algorithms and suggest the correct one for lifetime calculation of IGBT power modules based on the thermo-mechanical FEM analysis.
Keywords :
finite element analysis; insulated gate bipolar transistors; invertors; life testing; modules; power semiconductor devices; thermal analysis; IGBT power modules; amplitude extraction; counting methods; cycle counting algorithms; lifetime calculation; mission profile; thermal cycle; thermo-mechanical FEM analysis; Estimation; Finite element methods; Insulated gate bipolar transistors; Multichip modules; Strain; Stress; Wires; IGBT; Mission profile; Power cycling; Reliability;
Conference_Titel :
Power Electronics and Applications (EPE 2011), Proceedings of the 2011-14th European Conference on
Conference_Location :
Birmingham
Print_ISBN :
978-1-61284-167-0
Electronic_ISBN :
978-90-75815-15-3
