DocumentCode :
553925
Title :
Microelectrodes: When sensing has nonsense. A sensitivity analysis using finite element modelling
Author :
Moretti, F.N. ; Cabrera, J.L. ; Battaglia, G.A. ; Pivetta, O.H. ; Luna, M.C.
Author_Institution :
GTB Group, Univ. Tecnol. Nac. (UTN-FRA), Buenos Aires, Argentina
fYear :
2011
fDate :
11-12 Aug. 2011
Firstpage :
1
Lastpage :
5
Abstract :
This work presents an electrical analysis of tetrapolar measurements oriented to establish major sensitivity zones in a sensor array for maximizing impedance detection. The study of the sensor was focused on maximizing impedimetric biomass detection to make a stratified analysis of the sample in Electrical Impedance Spectroscopy (EIS). Finite Element Method (FEM) modelling was used to examine the behaviour of a Wenner-Alpha sensor array of 8 steps. An AC/DC quasi-static current mode was used for the computational model. The sensor was simulated for every step in sensitivity and impedance measurements and also fabricated and contrasted with experimental data. Negative sensitivity zones which are critical for impedance or electrochemical detection have been detected and delimited to establish proper detection during microelectrode sensing conditions. This simplified model is a useful and valid tool for understanding the sensitivity spectrum map of an EIS sensor.
Keywords :
electric impedance measurement; electrochemical sensors; finite element analysis; microelectrodes; microsensors; sensitivity analysis; sensor arrays; AC-DC quasi-static current mode; EIS; FEM modelling; Wenner-Alpha sensor array; computational model; electrical analysis; electrical impedance spectroscopy; electrochemical detection; finite element modelling; impedance detection; impedimetric biomass detection; microelectrode sensing conditions; sensitivity analysis; stratified analysis; tetrapolar measurements; Arrays; Current measurement; Electrodes; Finite element methods; Impedance; Impedance measurement; Sensitivity; Biomass detection; EIS; Electric Impedance; FEM; Wenner-Alpha array;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Argentine School of Micro-Nanoelectronics Technology and Applications (EAMTA), 2011
Conference_Location :
Buenos Aires
Print_ISBN :
978-1-4577-1236-4
Type :
conf
Filename :
6021286
Link To Document :
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