DocumentCode :
553940
Title :
Notice of Retraction
Study on objective evaluation of seam pucker based on wavelet probabilistic neural network
Author :
Li Yanmei ; Qiu Xiaokun ; Jiang Zhenzhen
Author_Institution :
Fashion Coll., Shanghai Univ. of Eng. Sci., Shanghai, China
Volume :
1
fYear :
2011
fDate :
26-28 July 2011
Firstpage :
259
Lastpage :
262
Abstract :
Notice of Retraction

After careful and considered review of the content of this paper by a duly constituted expert committee, this paper has been found to be in violation of IEEE´s Publication Principles.

We hereby retract the content of this paper. Reasonable effort should be made to remove all past references to this paper.

The presenting author of this paper has the option to appeal this decision by contacting TPII@ieee.org.

A new method to objectively evaluate seam pucker is brought out in this paper. Firstly, AATCC 88B seam pucker standard pictures are taken by digital camera. After wavelet transform of images, the six parameters that are standard deviation of horizontal, vertical and diagonal detail coefficients on 5th dimension, horizontal detail coefficients and histogram and image entropy are extracted, on 4th are extracted. Then, objective evaluation model of seam pucker based on probabilistic neural network is constructed and its prediction accuracy is more than 90% by test. This prediction model can be used to evaluate seam pucker grades of unknown samples, so that to overcome ambiguity and uncertainty of subjective evaluation.
Keywords :
clothing industry; entropy; image processing; neural nets; probability; production engineering computing; wavelet transforms; digital camera; image entropy; seam pucker; standard deviation; wavelet probabilistic neural network; wavelet transform; Accuracy; Correlation; Predictive models; Probabilistic logic; Wavelet analysis; Wavelet transforms; objective evaluation; probabilistic neural network; seam pucker; wavelet transform;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Natural Computation (ICNC), 2011 Seventh International Conference on
Conference_Location :
Shanghai
ISSN :
2157-9555
Print_ISBN :
978-1-4244-9950-2
Type :
conf
DOI :
10.1109/ICNC.2011.6021915
Filename :
6021915
Link To Document :
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