DocumentCode :
554165
Title :
Remote intelligent fault diagnosis of analog circuit
Author :
Qing Yang ; Yuanyuan Zhu ; Feng Wu
Author_Institution :
Sch. of Inf. Sci. & Eng., Shenyang Ligong Univ., Shenyang, China
Volume :
3
fYear :
2011
fDate :
26-28 July 2011
Firstpage :
1677
Lastpage :
1680
Abstract :
A remote intelligent fault diagnosis approach of analog circuit based on probabilistic neural network (PNN) and virtual instrument technology, called RPNN, is proposed. Firstly, PNN is used to classify the faults. Then, remote fault diagnosis is realized by virtual instrument technology. Simulation results illustrate that RPNN is feasible to soft fault diagnosis in analog circuit. RPNN can provide an accepted degree of accuracy in fault classification under different soft fault conditions and can be operated remotely from another site connected to the server via the World Wide Web.
Keywords :
analogue circuits; circuit analysis computing; fault diagnosis; neural nets; virtual instrumentation; analog circuit; probabilistic neural network; remote intelligent fault diagnosis; soft fault diagnosis; virtual instrument technology; Analog circuits; Browsers; Circuit faults; Computational modeling; Fault diagnosis; Probabilistic logic; Training; PNN; RPNN; analog circuit; fault diagnosis; remote LabVIEW;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Natural Computation (ICNC), 2011 Seventh International Conference on
Conference_Location :
Shanghai
ISSN :
2157-9555
Print_ISBN :
978-1-4244-9950-2
Type :
conf
DOI :
10.1109/ICNC.2011.6022382
Filename :
6022382
Link To Document :
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