DocumentCode :
554371
Title :
Ageing condition inspection system for electrical contact based on micro-current contact resistance trend tracker
Author :
Shi Jie
Author_Institution :
China Nucl. Power Technol. Res. Inst., Suzhou Nucl. Power Instn. Co., Ltd., Suzhou, China
Volume :
2
fYear :
2011
fDate :
12-14 Aug. 2011
Firstpage :
613
Lastpage :
616
Abstract :
An equipment which was used to inspect the ageing condition of electrical contact by track the trend of contact resistance under micro-current was developed. Compared with existing technology, the equipment can not only measures the contact resistance under micro-current(100 μ A) which is propitious to evaluating the ageing condition of a contact, but also grasp the trend that contact resistance follows the changed current (range of 100 μ A to 1A) which is help to estimate where a contact should be used and which type of contact should be used in specific situation. The scanning electron microscopy and Energy Dispersive Analysis System of X-ray were used to verify the ageing condition.
Keywords :
ageing; contact resistance; electrical contacts; inspection; X-ray condition; ageing condition inspection system; contact resistance; current 100 muA to 1 A; electrical contact; energy dispersive analysis system; microcurrent contact resistance trend tracker; scanning electron microscopy; Contact resistance; Current measurement; Electrical resistance measurement; Films; Surface morphology; Voltage measurement; ageing condition; electrical contact; energy dispersive analysis system of X-ray; micro-current contact reslstance(MCCR); scanning electron microscopy;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic and Mechanical Engineering and Information Technology (EMEIT), 2011 International Conference on
Conference_Location :
Harbin, Heilongjiang, China
Print_ISBN :
978-1-61284-087-1
Type :
conf
DOI :
10.1109/EMEIT.2011.6023176
Filename :
6023176
Link To Document :
بازگشت